mmc2017 is the perfect place to see how Hitachi is transforming EM and SPM. Come along to share your microscopy challenges with our global applications specialists who’ll be on hand to listen and inform.
Learn about our new activity in SPM, especially SÆMIC, our complete solution for correlative AFM-SEM. SÆMIC enables more comprehensive understandning of complex materials by quickly and easily locating sites of interest in SEM, and correlating SEM imaging with SPM measurements of electrical, mechanical or magnetic properties. It’s even possible to undertake all processes including cross-sectioning, SEM and SPM without exposure to air – critical for oxidising materials.
Unique STEM/SEM with EELS
Find out about our new SU9000 30kV STEM/SEM with EELS directly from our applications specialists. Combining secondary electron and STEM imaging together with EELS, diffraction, high solid angle EDX and even in-situ capability at 30kV or below gives the opportunity for deeper insights on beam sensitive and low contrast materials.
Benchtop SEM, ion milling, sample cleaning, SPM and fieldemission SEM will all be available for practical demonstrations and sample runs. To book time on an instrument or simply to arrange a detailed discussion with one of our applications specialists contact us on email@example.com
You can visit Hitachi at the mmc2017 exhibition on stand number 301.