Following the tremendous success of previous meetings, the 5th UK FIB & EM Prep User Group Meeting will take place at mmc2017 on Tuesday 4 July
The UK FIB & EM Prep User Group has been organized to provide an open forum for FIB users and all users of EM specimen preparation equipment to share technique advances, discuss best practices, present experimental and theoretical findings/discoveries, exchange tips for preparation of difficult materials and learn about new developments in both instrumentation and techniques, as well meet new colleagues and old friends.
This meeting is aimed at researchers, failure analysis engineers, PhD students, and anyone having a need to understand today’s FIB and EM sample preparation technologies. If you are interested in FIB or EM sample preparation techniques, please do join us at mmc2017.
Dual beam FIB microscopy: Enabling multiscale correlative CT - Phil Withers (University of Manchester)
You can register to attend this free meeting when you register to attend mmc2017.
This meeting is generously sponsored by