FIB & EM Prep User Group Meeting

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03 - 06 July 2017, Manchester, UK

Following the tremendous success of previous meetings, the 5th UK FIB & EM Prep User Group Meeting will take place at mmc2017 on Tuesday 4 July

The UK FIB & EM Prep User Group has been organized to provide an open forum for FIB users and all users of EM specimen preparation equipment to share technique advances, discuss best practices, present experimental and theoretical findings/discoveries, exchange tips for preparation of difficult materials and learn about new developments in both instrumentation and techniques, as well meet new colleagues and old friends.

This meeting is aimed at researchers, failure analysis engineers, PhD students, and anyone having a need to understand today’s FIB and EM sample preparation technologies. If you are interested in FIB or EM sample preparation techniques, please do join us at mmc2017.

Confirmed Speakers

Dual beam FIB microscopy: Enabling multiscale correlative CT - Phil Withers (University of Manchester)

You can register to attend this free meeting when you register to attend mmc2017.


This meeting is generously sponsored by

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mmc2017 is the latest in an impressive list of events dating back to the 1960s starting with the Micro conference and exhibition series. This later became MicroScience which grew ever-bigger until 2010. The RMS hosted the European Microscopy Congress in 2012 which was the catalyst for the current Microscience Microscopy Congress series.

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