Following the tremendous success of previous meetings, the 5th UK FIB & EM Prep User Group Meeting will take place at mmc2017 on Tuesday 4 July
The UK FIB & EM Prep User Group has been organized to provide an open forum for FIB users and all users of EM specimen preparation equipment to share technique advances, discuss best practices, present experimental and theoretical findings/discoveries, exchange tips for preparation of difficult materials and learn about new developments in both instrumentation and techniques, as well meet new colleagues and old friends.
This meeting is aimed at researchers, failure analysis engineers, PhD students, and anyone having a need to understand today’s FIB and EM sample preparation technologies. If you are interested in FIB or EM sample preparation techniques, please do join us at mmc2017.
This meeting will be taking place in Cobden rooms 3&4 of Manchester Central.
10:20 Dual beam FIB microscopy: Enabling multiscale correlative CT
Philip Withers (University of Manchester)
10:50 Plant Tissues: Protocol Optimization for Transmission Electron Microscopy
Sara Bonucci (Gulbenkian Institute, Portugal)
11:05 Evaluating focused ion beam patterning for nanowire growth using computer vision
Aleksander Mosberg (NTNU, Norway)
11:20 CryoFIB at Diamond Light Source
Corey Hecksel (Diamond)
11:35 Enabling direct observation of the microstructure of organic reaction mixtures by scanning electron microscopy
Alexey Kashin (N.D. Zelinsky Institute of Organic Chemistry, Russia)
11:45 Picosecond laser ablation for SEM, XRM and Atom Probe sample preparation
Dr Michael Hassel-Shearer (Gatan Inc.)
12:00 Lunch and Exhibition
14:00 Helium, Neon and Gallium Focussed-Ion-Beam Methods for Nanodevice Fabrication
Paul Warburton (UCL)
14:30 Bone, scallop, coral: unravelling the nanoscale secrets of biominerals using FIB and electron microscopy
Roland Kroger (University of York)
14:45 Extending developments in 2D microanalysis (EDS and EBSD) to 3D material characterisation
John Lindsey (University of Manchester/Oxford Instruments)
15:15 Advances in 3D imaging using the Crossbeam
William Harris (Carl Zeiss)
15:30 Automating S/TEM preparation for diverse sample types
Daniel Phifer (FEI)
15:45 Round Table Discussion
You can register to attend this free meeting when you register to attend mmc2017.
This meeting is generously sponsored by