HOME ABOUT News SPONSORED ARTICLE: FEI's Correlative Multiscale Tomography for Additively Manufactured Components

03 - 06 July 2017, Manchester, UK

FEI part of Thermo Fisher Scientific LogoThe Correlative Multiscale Tomography (CMT) workflow combines advantages of many imaging modalities (see Figure 1), e.g. electron/ion microscopy (EM, IM), X-Ray computed tomography (CT), and scalar and vector fields mapping, e.g. EBSD, EDS, Raman, electromagnetic field, residual stress field, etc.

Combining two and three dimensional data of these imaging modalities and the spatial registration of scalar and vector fields, at different length scales and time (temporal 4D imaging) for the same region of interest (ROI), ultimately leads to true material’s insight and understanding. Current trends point to CMT as a crucial element of an intelligent closed-loop feedback control and sensing system for advanced and “green” manufacturing techniques, like additive manufacturing.

FEI Correlative Multiscale Tomography for Additively Manufactured Components

Fig1. Figure 1 shows Thermo Fisher Scientific instruments for Correlative Multiscale Tomography in materials science. Graph shows main 3D imaging methods. Note: Helios PFIB is an essential link in the CMT workflow.

Advent of additive manufacturing (AM) techniques, such as Electron Beam Melting (EBM), Selective Laser Melting (SLM), Laser Powder Deposition (LPD), Wire + Arc Additive Manufacturing (WAAM), etc. to some extent allow simulating the natural materials and complex structures that cannot be produced using metallurgical routes and subtractive methods. Design and additive manufacturing of these components can be assisted with computer-aided design (CAD) and finite-element analysis (FEA) for better control of shape, interconnectivity and tailored mechanical properties. Furthermore, AM technology promises to reduce part cost by reducing material wastage and time to market.

However, AM processing conditions, material powder size, morphology and impurities may have a significant impact on the component morphology and mechanical performance leading to large deviations from the designed parameters. The subject of additive manufacturing is very recent, leading to various aspects that remain to be established. The most important are: (i) functional design and mechanical properties modelling, (ii) AM-specific alloy and precursor compositions/morphology, (iii) processing control, monitoring and operation, (iv) component testing (static, dynamic and environmental), and (v) multiscale microstructure characterization, detects detection and micromechanical testing. Thus, a complete understanding of these five major aspects (i-v) requires a multiscale correlative imaging approach, which brings together 3D (or 4D temporal study) multimodal information at each length scale and feeds-back various information (grain size and orientation, defect locations, detrimental residual stress distribution, variation of chemical composition, etc.) to the additive manufacturing workflow. Thermo Fisher Scientific instruments such as the FEI HeliScan microCT, FEI Helios Plasma FIB DualBeam and FEI Talos S/TEM enable a correlative multiscale tomography workflow from macro scale down to the atomic level for additively manufactured components.

  • HeliScan is an innovative and unique X-Ray micro CT using a helical trajectory for stitching free imaging of larger volumes, high aspect ratio components and region of interest scans. HeliScan has a high cone angle X-ray source for higher flux and an iterative reconstruction algorithm combined with patented movement correction software.
  • Helios PFIB, a high-end plasma-based DualBeam enables dramatically improved material removal rates compared to traditional Ga FIB milling, while maintaining exceptional surface quality and high-contrast, ultra-high resolution imaging performance. It is designed for high-throughput sample processing, large-volume 3D materials characterization and extreme high-resolution imaging in both 2D and 3D. For large-scale cross-sectioning, large-volume 3D data collection (multidetector SEM, EBSD, EDS), large-scale TEM sample preparation and large-scale patterning, the Helios PFIB provides the highest quality of data in the shortest time.
  • Talos S/TEM is designed for fast, precise and quatitative characterization of nano-materials. It accelerates materials imaging and analysis through higher data quality and faster acquisition by simplified and automated operation. It combines outstanding high-resolution STEM and TEM imaging, unparalleled advances in EDS signal detection and 3-D chemical characterization with compositional mapping via its unique integrated detector solutions.

Authors: Bartlomiej Winiarski1,2, Dirk Laeveren3, Charles Austin Wade3, 4
1 Thermo Fisher Scientific (FEI Czech Republic s.r.o.), Vlastimila Pecha 12, Brno 627 00, Czech Republic

2 Henry Moseley X-ray Imaging Facility, School of Materials, University of Manchester, M13 9PL, U.K.

3 Thermo Fisher Scientific, Achtseweg Noord 5, 5651GG Eindhoven, The Netherlands

4 Materials Performance Centre, University of Manchester, Manchester M13 9PL, UK

Stay up to date

Subscribe to the RMS newsletter that will be packed with up to date information and notifications in the run-up to mmc2017. Details provided here will not be passed to third parties.

Once you have hit Submit you will receive a confirmation email.

No topics.
Related Posts

Follow us

Share this page



Free Exhibition Visitor Registration Open

Posted by:

You can now register in advance to access all that the exhibition has to offer including free training opportunities

Read full post »


New Industry Meeting announced for mmc2017

Posted by:

The British Measurement and Testing Association will hold an Optical Inspection seminar at mmc2017

Read full post »


93% of exhibition space sold

Posted by:

Space for mmc2017 is nearly sold out and there are companies still enquiring. Act quickly if you plan to join us.

Read full post »

Previous events

mmc2017 is the latest in an impressive list of events dating back to the 1960s starting with the Micro conference and exhibition series. This later became MicroScience which grew ever-bigger until 2010. The RMS hosted the European Microscopy Congress in 2012 which was the catalyst for the current Microscience Microscopy Congress series.

Visit mmc2015 >>

Visit mmc2014 >>

Using the site

Privacy Policy

Terms & Conditions

Site Map

If you notice inaccuracies or omissions on the mmc2017 site, please report them to