At Hitachi we want to help you learn about new techniques and develop your microscopy. That’s why at mmc2017 we’re not just demonstrating our instruments, we’re also offering you the chance to join our wide ranging on-stand education programme.
We’ll be covering topics as diverse as corrleative microscopy, cross-sectioning techniques, automated particle/phase analysis and in-situ TEM, as well as emerging techniques like ptychography and advanced low kV analytical STEM. This is an open forum, so drop by for your preferred session.
12.30 Solutions for correlative SEM-SPM
13.00 Electron ptychography & holography for nanoparticle studies
13.30 Automated particle analysis made easy (in association with Oxford Instruments)
12.30 New opportunities with analytical STEM <30kV (EELS, EDX and diffraction)
13.00 Total solutions for bespoke in-situ TEM: an in house-approach
13.30 Ultra-high resolution, light element EDX & EBSD with immersion lens FESEM
(in association with Oxford Instruments)
12.30 Preparing flawless cross-sections, whatever the material
13.00 Ionic liquid: a unique approach for hydrated specimens in SEM & TEM
Of course we’ll also be offering live demonstrations of equipment, including our brand new AFM5100 and AFM5500 SPMs as well as the the ever popular TM3030 bechtop SEM, FlexSEM compact SEM and SU5000 schottky VP-SEM.
To find out more about our education programme or to book a demo of our SEM’s or SPMs contact email@example.com