The next generation of in-situ open cell environmental double aberration corrected e-(S)TEM: ARTEMIS
- Abstract number
- 348
- Presentation Form
- Poster
- Corresponding Email
- [email protected]
- Session
- Poster Session One
- Authors
- Dr. Leonardo Lari (1), Em. Prof. Ed Boyes (1), Em. Prof. Pratibha Gai (1), Prof. Vlado Lazarov (1)
- Affiliations
-
1. University of York
- Keywords
in-situ
ETEM
Environmental TEM
- Abstract text
Atomic resolution electron microscopy is a powerful and increasingly important tool for nanomaterials characterisation that is vital to solutions of key problems in energy, IT, health, safety, transport, the environment and economy.
An in-situ open cell environmental TEM/STEM facility based on a JEOL NeoArm cold FEG double corrected instrument (ARTEMIS) has been installed in York and is about to be accepted at the time of this abstract submission. Recent progresses in vacuum modification and open cell gas injection systems will provide a much-improved version of the old proof-of-principle ETEM/STEM based on the first generation of aberration corrected microscopes, the JEOL 2200FS.
Here we will discuss the wide range of capabilities associated with the machine based on variable voltage, Gas/vapour injection system, diffraction and EDX/EELS spectroscopy, and the new science enabled by this facility.
Moreover, we will present the first results after installation and in addition, in-situ results, that include oxidation/reduction and H2O vapour exposure on thin films and nanoparticles in a low pressure open cell environment, that were performed on the first generation environmental TEM/STEM, where single atom visualisation by HAADF-STEM in an open cell controlled gas reaction environment and temperature was demonstrated [1,2].
Acknowledgement:
We thank the EPSRC (UK) for funding, through capital infrastructure grant, ‘Aberration-Corrected Scanning Transmission Electron Microscope with atomic resolution spectroscopy under controlled environmental conditions: AC-eSTEM’; EP/S033394/1.
- References
[1] E. D. Boyes, M. R. Ward, L. Lari, and P. L. Gai, “ESTEM imaging of single atoms under controlled temperature and gas environment conditions in catalyst reaction studies ”, Annalen der Physik 525 (2013) 423.
[2] P.L. Gai, L. Lari, M.R. Ward and E. D. Boyes, “Visualisation of single atom dynamics and their role in nanocatalysts under controlled reaction environments” Chemical Physics Letters 592 (2014) 355