Characterizing Ferroelectric Materials with Advanced PFM Methods

Session

Poster Session Two

Authors

Dr Mickael Febvre (2), Dr Bede Pittenger (1), Dr Peter DeWolf (1)

Affiliations

1. bruker
2. Bruker

Keywords

AFM, PFM, Electrostatic force, nanoelectrical

Abstract text

Piezoresponse force microscopy (PFM) is a powerful technique for studying ferroelectric materials due to the high sensitivity and nanometer-level resolution that it inherits from atomic force microscopy (AFM). PFM-based spectroscopic methods, such as switching spectroscopy PFM (SS-PFM) and DataCube™ PFM (DCUBE PFM), allow characterization of key parameters of ferroelectrics, such as coercive voltages, nucleation voltages, saturation responses, and more. Unfortunately, quantification and interpretation of PFM results can be complicated by artifacts. In this talk, we discuss the best modes and practices for optimizing PFM measurements to achieve reliable results.

A short overview will be provided of the many variants of PFM optimized to solve different problems and study different aspects of electromechanical response. Next, we will focus on the DCUBE PFM and SS-PFM modes and how they can help with many of these issues. Additionally, the benefits of both resonance and sub-resonance PFM are discussed along with how laser position can be optimized to improve measurement accuracy.

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