Microbeam Analysis of ZnO Thin Films and ZnO-CdS Hetrojunctions
- Abstract number
- 547
- Presentation Form
- Poster
- DOI
- 10.22443/rms.mmc2023.547
- Corresponding Email
- [email protected]
- Session
- Poster Session Three
- Authors
- Dr. Saad Potrous (1)
- Affiliations
-
1. University of Basra
- Keywords
EDX analysis , Microscopical Examination , ZnO Thin Film , ZnO/CdS Hetrojunction
- Abstract text
Thin films of ZnO have been prepared by vacuum evaporation method. Microbeam analysis using SEM techniques have been used to investigate the surface structure and chemical composition of ZnO thin films. ZnO-CdS hetrojunctions have also been prepared to investigate the interdiffusion at the junction for as-prepared and annealed samples. Results show that the diffusion of atomic species have increased for annealing films.
- References
Potrous S.M., Microbeam Analysis of Solar Energy Materials, PhD Thesis,
University of Dundee,Scotland, U.K. (1990).