HORIBA NanoRaman™: Localised Spectroscopy for AFM
- Abstract number
- 512
- Corresponding Email
- [email protected]
- Session
- Nanoscale Probing of Physical Properties via AFM & SPM
- Authors
- Dr Cian Bartlam (1)
- Affiliations
-
1. HORIBA UK Ltd.
- Abstract text
Scanning probe microscopies (SPM) enable researchers to access a wealth of physical information down to the limit of the nanoscale in a range of different application fields. While electrical, magnetic, mechanical and extreme topographic data can now be routinely acquired using SPM, chemical information is typically accessed through spectroscopic techniques, which can require the transfer of samples between analytical instruments. This can often lead to a loss in positional information, particularly on samples with little optical contrast.
We will discuss the need for colocalised measurements and how enabling researchers to couple SPM with Raman spectroscopy results in obtaining valuable chemical and physical information for better understanding and development of new materials.
256 × 256 points simultaneously acquired topography image (right) and composite Raman map (left) of graphene.
