XRF in art, the wonder of elements

Session

Analysis and Imaging in Heritage Science

Authors

Michele Gironda (1)

Affiliations

1. Bruker Nano Analytics

Keywords

Energy Dispersive Spectroscopy (EDS), Wavelength Dispersive Spectrosocopy (WDS), Electron Backscatter Diffraction (EBSD), Micro-XRF on SEM, Elemental Analysis, Elemental Mapping, Trace Element Detection, Microstructural Analysis, Non-Destructive Analysis, Art Analysis, Archaeological Analysis 

Abstract text

Bruker offers a wide range of complementary analytical solutions that cross the spectrum of X-ray Fluorescence and Electron Microscopy. These systems allow for the elemental and compositional analysis of solid inorganic materials, in configurations that range from portable handheld analyzers to lab-oriented instruments. In addition, we have also been exploring the combination of complementary techniques for matter analysis which can play a key role in both art and conservation, and academic research. 

Commonly used and non-invasive analysis techniques include Handheld-XRF, micro-XRF, Handheld-Raman, and Handheld-FTIR. These may be portable, allowing devices to be taken to an object or site, and enable much information to be gained without significant further disruption. However, many of these techniques are limited by the scale of measurement (e.g. handheld XRF has a spot size of between 3 and 8mm), and elemental quantification may not be possible for all object materials. To achieve micron to sub-micron scale imaging and elemental characterization electron microscopy can be used, which represents one of the few easily accessed techniques for analysis at the finest scales. Electron microscopy is commonly needed to substantiate interpretations made from other techniques.

Bruker Nano Analytics offers a range of analyzers for scanning electron microscopes allowing for the investigation of samples with different techniques, all managed via a single software interface. Analyzers range from: standard-configuration EDS detectors for elemental analysis; Wavelength Dispersive Spectrometers for SEM, which when combined with EDS provides superior elemental peak resolution; EBSD and TKD for the crystallographic structure analysis of samples; and micro-XRF on SEM, which uses an external x-ray source coupled with a standard EDS detector to provide trace element detection limits down to 10ppm for heavier elements. In the presentation we’ll highlight the XFlash FlatQUAD – Bruker's annular silicon drift detector.