EMAG 2025

Organised by the Institute of Physics's Electron Microscopy and Analysis Group (EMAG), the 2025 EMAG Conference will be incorporated into mmc2025.

EMAG Invited Speakers

Patricia Abellan

CNRS, France

Caterina Ducati

University of Cambridge, UK

Oriol Gavalda-Diaz

Imperial College London, UK

Martha Ilett

School of Chemical and Process Engineering, University of Leeds, UK

Lewys Jones

Trinity College Dublin, Ireland

Ana Sanchez

University of Warwick, UK

Mary Scott

UC Berkeley, USA

Luiz Tizei

CNRS, France

Peter van Aken

Max Planck Institute, Germany

Ton van Helvoort

Norwegian University of Science and Technology (NTNU), Trondheim, Norway

mmc2025 EMAG Keywords

Instrumentation, Techniques and Quantitative Microscopy

Advanced EM, electron crystallography and diffraction studies
4D-STEM, phase-sensitive, ptychography and Lorentz techniques
Advances in (S)TEM instrumentation and techniques
Advances in SEM (CL, EBSD, spectroscopy, STEM, etc)
Spectroscopy and spectrum imaging
Correlative microscopy
Tomography and three-dimensional electron imaging
In situ and dynamic microscopy techniques and development
Low Dose/Low Voltage Imaging and analysis
Advances in cryogenic TEM and cryogenic sample preparation
Focused Ion Beam techniques and advances (including FEBID and sample preparation)
Detector/Camera Technologies and New Instrumentation
Automated Control, Advanced Data Processing and Modelling Techniques
‘Smart’ collection, deep/machine learning and advanced processing of large datasets

Materials

Structural materials, composites and metallurgy
Functional semiconductor, oxide and advanced materials
Natural materials, geological materials and mineralogy
Catalytic materials and supports
Low-dimensional materials and nanomaterials
Energy materials (storage, generation, efficiency, etc)
Biological Materials, biomaterials, soft matter, polymers and composites
Surface imaging and modification
Microscopy of thin films, interfaces and heterostructures
High resolution chemical and structural analysis