The correlation between ptychographic phase and ADF intensity: A new approach for quantitative STEM

Session

Stream 2: EMAG - Automated Control, Advanced Data Processing

Authors

Dr Ali Mostaed (1), Prof Angus I. Kirkland (1, 2, 3), Prof Peter Nellist (1)

Affiliations

1. Department of Materials, University of Oxford
2. electron Physical Science Imaging Centre (ePSIC), Diamond Light Source
3. Rosalind Franklin Institute, Harwell Campus

Keywords

Ptychography, ADF, Quantitative STEM

Abstract text

The abstract content is not included at the request of the author.

References

[1] T. Seki, Y. Ikuhara, N. Shibata, Ultramicroscopy 193 (2018) 118–125.

[2] L.J. Allen, A.J. D׳Alfonso, S.D. Findlay, Ultramicroscopy 151 (2015) 11–22.